Document Type : Research Articles
Authors
- farzaneh jahanshahi javaran 1
- Somayyeh Jafarali Jassbi 1
- Hossein Khademolhosseini 2
- Razieh Farazkish 3
1 Department of Computer Engineering, SR.C., Islamic Azad University, Tehran, Iran.
2 Department of Computer Engineering, Bey. C., Islamic Azad University, Beyza, Iran.
3 Department of Computer Engineering- BT.C., Islamic Azad University, Tehran, Iran.
Abstract
As the field of nanotechnology rapidly advances and the need for faster processing in smaller dimensions grows, as does the integration of Very Large-Scale Integration (VLSI) technology. These difficulties include things like large-scale area needs, high power consumption, and low operating speeds, which call for new approaches to lessen these constraints. Developed and implemented at the nano-based, Quantum-Dot Cellular Automata (QCA) technology presents itself as a viable way around these obstacles. The advent of QCA technology heralds our entry into the nano-scale realm, where the advantages of enhanced processing speeds, reduced dimensions, and minimal power consumption become manifest. This article focuses on the 7-input majority gate, a fundamental component in QCA technology, distinguished by its fault-tolerant characteristics. The primary objective is to present the design and simulation of this key gate within the context of QCA technology. Noteworthy among the merits of the 7-input majority gate is its capacity to implement logic gates with a greater number of inputs, consolidating multiple functionalities within a single gate. QCADesigner and QCAPro software have simulated the given gate, and the results demonstrate the exact and correct operation of the gate. This gate generates the output signal every 0.25 clock cycles and is built with 66 quantum cells within a 0.03 µm2. The simulation results demonstrate the precision of the circuit's operation. Additionally, basic fault-tolerant gates such as 4-input AND, and 4-input OR using a 7-input fault-tolerant majority gate have been suggested in order to illustrate the proper operation of the new gate.
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